Technology Roadmap and On-Wafer Measurements

On-wafer measurements refer to the process of testing and analyzing electronic components, such as semiconductor devices, microchips, and integrated circuits, while they are still on the wafer substrate before being separated into individual devices. This technique allows for highly precise and efficient testing, as it eliminates the need to package and separate individual components for evaluation. On-wafer measurements involve using specialized equipment, such as probe stations and vector network analyzers, to assess the electrical characteristics, performance, and functionality of the devices. This testing method is critical in the semiconductor industry for quality control, process optimization, and developing advanced electronic components.